Advanced Instrumentation for Nano-Analytics

The rapid evolution of materials science, nanotechnology, and life sciences is driving unprecedented demand for advanced analytical instrumentation capable of operating at the nanoscale. In recent decades, materials have become increasingly complex, featuring smaller dimensions, multi-functional properties and intricate internal architectures. Similarly, biological research has embraced nanoscale investigations to explore cellular processes, molecular interactions and the behaviour of nanoparticles in biological environments.

This evolving context gives rise to several major challenges for characterization and analysis techniques:

As structures continue to shrink, traditional analytical techniques struggle to resolve features at the sub-nanometer or nanometer scales which is required. Nano-imaging and nano-analytics must keep pushing the boundaries of spatial resolution.

It is increasingly critical to accurately identify and quantify trace elements, isotopes, and molecular species at low concentrations (< ppm levels), particularly in semiconductor, battery, biological and environmental applications.

Given the sheer volume of data generated by high-resolution imaging and spectroscopy, high-throughput capabilities and automated workflows are needed to enable efficient, large-scale studies.

No single analytical technique can deliver all the necessary information. Integrating structural, chemical and functional data using different methods is therefore essential for a holistic understanding of materials and biological systems.

New instruments produce multi-dimensional datasets – such as 3D chemical maps and 4D correlative data – requiring advanced algorithms and software tools for data processing, management and analysis.

There is a growing demand for lightweight, robust analytical instruments capable of operating in harsh terrestrial environments or on extraterrestrial missions, such as resource prospecting on the Moon or Mars.

Advanced preparation and analysis techniques are required for handling delicate biological and soft matter samples, particularly to prevent artefacts from beam damage and environmental degradation.

Objectives

The aim of the Advanced Instrumentation for Nano-Analytics group is threefold:

Innovate at the frontier of instrumentation

The group designs, prototypes and validates new generations of analytical systems based on charged particle beams (electrons and ions), often pushing the boundaries of what is technically achievable. These systems are purpose-built to deliver unprecedented spatial resolution, sensitivity and data reproducibility.

Enable correlative and multi-modal workflows

Beyond hardware development, the group focuses on integrating diverse characterization methods into coherent, user-friendly workflows. The goal is to correlate structure, chemistry and functional properties at the nanoscale to provide insights that would otherwise be unattainable.

Bridge fundamental research and application

Developments are applied across diverse fields – materials science, life sciences, environmental sciences and space research – while ensuring a smooth technology transfer to industry partners. The strong collaborations of the group with leading instrument manufacturers guarantee that our innovations rapidly reach real-world laboratories and operational environments.

The group is characterized by:

  • A multidisciplinary team of physicists, engineers, chemists, biologists and computer scientists.
  • A holistic approach encompassing fundamental studies, instrument design, data treatment and real-world applications.
  • Long-term strategic collaborations with academic institutions and industrial partners worldwide. The partnerships span across top universities and research institutes in Europe and North America.
     

Scope of Expertise

Understanding the interactions between energetic ions and matter is essential for optimizing nano-analytical instruments. The group conducts comprehensive fundamental studies, combining experimental investigations (e.g., sputtering yields, secondary ionization probabilities) and simulations (Monte Carlo, Molecular Dynamics (MD), Density Functional Theory (DFT) calculations), of which the 
key outcomes include:

  • Improved quantification strategies that minimize matrix effects.
  • Optimized beam parameters that minimize damage and maximize information yield.

Development of high-performance SIMS add-on systems

The Advanced Instrumentation for Nano-Analytics group develops compact Secondary Ion Mass Spectrometry (SIMS) add-on systems, which can be mounted on to various instruments, including helium ion microscopes (HIM), focused ion beam instruments (FIB), dual beam instruments (FIB-SEM), transmission electron microscopes (TEM) and ion implanters.

These SIMS systems incorporate all ion optical components necessary for them to be easily mounted on to existing instruments as add-on systems. The extraction and transfer optics maximize secondary ion extraction efficiency (>60%) without negatively impacting the focusing of the primary ion beam. The group’s mass spectrometers are based upon a compact magnetic sector double-focusing mass spectrometer, which offers the highest possible transmission, high mass resolution (M/ΔM up to 5000), full elemental mass range (H-U) and parallel detection of all masses using a full-size focal plane detector (FPD).

Several SIMS add-on systems have been developed and installed on various FIB platforms for high-sensitivity, highest lateral resolution (down to ultimate SIMS spatial resolution) and high-speed nanoscale 2D and 3D chemical imaging, i.e. HIM-SIMS, FIB-SEM-SIMS, npSCOPE, SIMS:ZERO, IonMaster).

Mass spectrometers for space and field applications

The group designs compact, lightweight mass spectrometers suitable for deployment in field-portable devices or integration into CubeSats. Applications include hydrological monitoring, environmental analysis and extraterrestrial resource prospecting.

Correlative Methodologies and Workflows

The Advanced Instrumentation for Nano-Analytics group is a leader in the development of correlative workflows that enables the seamless integration of high-resolution imaging (Electron Microscopy) with high-sensitivity chemical analysis (SIMS).

This approach allows:

  • 3D and 4D visualization of chemical and structural features.
  • Investigation of complex multi-component materials, devices and biological tissues to provide elemental, organic and molecular information.
  • Laser-based desorption/ionization coupled with Orbitrap High Resolution Mass Spectrometry, including low wavelength and laser post-ionization.
  • Avoidance of artefacts associated with sample topography, sample preparation and sample transfers between instruments.

The correlative methodologies of the group have proven instrumental in fields like:

  • Materials for energy conversion and storage.
  • Semiconductor device analysis.
  • Toxicity studies (e.g., Nanoparticles, PFAs, nanoplastics).
     

Modern nano-analytical techniques generate huge datasets requiring robust data treatment and analysis pipelines. As such, the group develops:

  • Advanced image registration and fusion techniques, particularly frequency-domain methods for the robust co-registration of datasets from different imaging modalities.
  • Automated peak detection and data interpretation software, streamlining SIMS data analysis.
  • Innovative visualization tools for complex multidimensional datasets, facilitating the extraction of scientific insights.

The goal is to democratize complex techniques like SIMS, making them more accessible to a broader range of researchers by minimizing the need for specialized expertise.
 

Key Assets and Facilities

The group benefits from state-of-the-art equipment, including:

  • 2 Zeiss ORION NanoFab HIM equipped with SIMS and STIM developed in-house.
  • 1 Thermo Fisher Scientific Scios DualBeam with SIMS developed in-house.
  • 1 Raith VELION with SIMS developed in-house.
  • 1 Thermo Fisher Scientific Tecnai F20 TEM modified for integrated SIMS.
  • 1 He-STIM microscope for ion transmission studies (Galileo) built in-house.
  • 2 prototype mass spectrometers for portable and space applications.
  • Specialized glovebox setups for cryogenic sample preparation and transfer.
  • Multiple custom-built test benches for ion and electron optics instrumentation.
     

Key Highlights


Commercialization of SIMS add-on system

The add-on SIMS system, a direct outcome of our R&D, is now commercially available and deployed worldwide. The AINA group developed the world’s first integrated Secondary Ion Mass Spectrometry system for the Zeiss ORION Helium Ion Microscope, achieving record-breaking 10 nm SIMS spatial resolution. Our magSIMS technology was subsequently adapted to a wide range of Focused Ion Beam (FIB) platforms, including those from Thermo Fisher Scientific (e.g., SCIOS, HELIOS and AQUILOS), Zeiss, and more recently, the Raith VELION (branded as IONMASTER). This expansion has enabled high-sensitivity elemental and isotopic analysis across various FIB and DualBeam systems, supporting applications in photovoltaics, battery, nanotoxicology and advanced materials research.

npSCOPE

The development of the npSCOPE platform has enabled groundbreaking studies in nanotoxicology, offering unprecedented imaging and analysis capabilities for biological samples under cryo conditions.

Scientific Impact
 

Our group members have authored numerous high-impact review papers and book chapters, including publications in Reports on Progress in Physics, Annual Review of Analytical Chemistry and Applied Physics Reviews.

Strong Industry Partnerships


We collaborate actively with industry leaders including Zeiss, Thermo Fisher Scientific, Raith and ZeroK NanoTech.

Strategic Research Collaborations


Our partnerships span across top universities and research institutes in Europe and North America.

Our people

ANDERSEN Dustin

Advanced Instrumentation for Nano-Analytics

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AUDINOT Jean-Nicolas

Advanced Instrumentation for Nano-Analytics

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BARRAHMA Rachid

Advanced Instrumentation for Nano-Analytics

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BENITO OLMOS Victor

Advanced Instrumentation for Nano-Analytics

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BERRO Zahraa

BERRO Zahraa

Advanced Instrumentation for Nano-Analytics

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BIESEMEIER Antje

Advanced Instrumentation for Nano-Analytics

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BOUTON Olivier

BOUTON Olivier

Advanced Instrumentation for Nano-Analytics

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COULBARY Chérif Boubacar

Advanced Instrumentation for Nano-Analytics

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DE CASTRO Olivier

Advanced Instrumentation for Nano-Analytics

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DELFINO Pablo Maria

Advanced Instrumentation for Nano-Analytics

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ESWARA MOORTHY Santhana

Advanced Instrumentation for Nano-Analytics

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GHERARDI Pol

Advanced Instrumentation for Nano-Analytics

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HOANG Quang Hung

Advanced Instrumentation for Nano-Analytics

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HUBER Kilian

Advanced Instrumentation for Nano-Analytics

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KUMMEL Matthieu

KUMMEL Matthieu

Advanced Instrumentation for Nano-Analytics

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MEZERETTE David

MEZERETTE David

Advanced Instrumentation for Nano-Analytics

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PURETI Rathaiah

Advanced Instrumentation for Nano-Analytics

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SCHUPPE Marie

Advanced Instrumentation for Nano-Analytics

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SHARMA Sayantan

Advanced Instrumentation for Nano-Analytics

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SURESH KUMAR Athira

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TITZE Michael

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Our latest projects

microPLAstox

Oral exposure to bio-based versus conventional nanoplastics: unravelling health hazards in humans using hand-in-hand in vitro gut models and multiscale analytics

FLUO-GUT

Oral exposure and gut-targeted toxicity of PFOA and its precursor 8:2 FTOH under chronic stress: when high resolution chemical imaging bridges food toxicology

Soil3D

Elucidating the 3D chemical and physical architecture of soil microstructures by combining spectromicroscopic techniques and developing of novel computational approaches

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Our latest publications

Time-of-flight scanning transmission ion microscopy with high energy resolution in the low keV range

Andersen D., Pureti R., Wirtz T., Eswara S.

Micron, vol. 205, art. no. 104038, 2026

Pyroelectric power generator for autonomous systems

Song L., Aravindhan A., Li J., Nouchokgwe Y., Khalil M., Ni F., Bousri N., Ramírez O., Polesel-Maris J., Gérard M., Glinsek S., Prah U., Bouton O., Usui T., Hirose S., Kovacova V., Defay E.

Joule, vol. 10, n° 5, art. no. 102340, 2026

Cryo-HIM-SIMS on the npSCOPE: Correlative Topographic, Transmitted and SIMS Imaging at Cryogenic Temperatures

Taubitz T., De Castro O., Andersen D., Berro Z., Hans S., Tabean S., Wachsmuth-Melm M., Hobler G., Nelissen I., Lucas F., Eswara S., Chlanda P., Wirtz T., Audinot J.N., Biesemeier A.

Analytical Chemistry, vol. 98, n° 17, pp. 12317-12327, 2026

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