Unit: Scientific Instrumentation and Process Technology
Ion-beam channeling in a single-surface modified Si membrane
Andersen D., Holeňák R., Tabean S., Ntemou E., Wirtz T., Hobler G., Primetzhofer D., Eswara S.
Applied Surface Science, vol. 709, art. no. 163734, 2025
Transmission electron microscopy with in-situ ion irradiation: Facilities and community
Hattar K., Kothari R., Chen W.Y., Daymond M.R., Eswara S., Field K.G., Gentils A., Hiroaki A., Jones L., Kazuto A., Miyamoto M., Ran G., Shibayama T., Smyth C.M., Was G.S., Hinks J.A.
Vacuum, vol. 240, art. no. 114525, 2025
Sharma S., Santiago A., Martinez-Ibañez M., Gerard M., Kumar A.S., De Castro O., Wirtz T., Eswara S.
Electrochimica Acta, vol. 536, art. no. 146728, 2025
Suresh Kumar A., Gerard M., Fleming Y., Sharma S., De Castro O., Wirtz T., Eswara S.
International Journal of Hydrogen Energy, vol. 154, art. no. 150290, 2025
Cressa L., Boillat P., Gerard M., Sun Y., Sharma S., De Castro O., Nojabaee M., Schmitz G., Wirtz T., Eswara S.
Electrochimica Acta, vol. 494, art. no. 144397, 2024