Unit: Scientific Instrumentation and Process Technology
Scanning Transmission Ion Microscopy Time-of-Flight Spectroscopy Using 20 keV Helium Ions
Mousley M., Tabean S., Bouton O., Hoang Q.H., Wirtz T., Eswara S.
Microscopy and Microanalysis, vol. 29, n° 2, pp. 563-573, 2023