Head of Unit
Unit: Scientific Instrumentation and Process Technology
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Time-of-flight scanning transmission ion microscopy with high energy resolution in the low keV range
Andersen D., Pureti R., Wirtz T., Eswara S.
Micron, vol. 205, art. no. 104038, 2026
Taubitz T., De Castro O., Andersen D., Berro Z., Hans S., Tabean S., Wachsmuth-Melm M., Hobler G., Nelissen I., Lucas F., Eswara S., Chlanda P., Wirtz T., Audinot J.N., Biesemeier A.
Analytical Chemistry, vol. 98, n° 17, pp. 12317-12327, 2026
Ion-beam channeling in a single-surface modified Si membrane
Andersen D., Holeňák R., Tabean S., Ntemou E., Wirtz T., Hobler G., Primetzhofer D., Eswara S.
Applied Surface Science, vol. 709, art. no. 163734, 2025
Sharma S., Santiago A., Martinez-Ibañez M., Gerard M., Kumar A.S., De Castro O., Wirtz T., Eswara S.
Electrochimica Acta, vol. 536, art. no. 146728, 2025
Suresh Kumar A., Gerard M., Fleming Y., Sharma S., De Castro O., Wirtz T., Eswara S.
International Journal of Hydrogen Energy, vol. 154, art. no. 150290, 2025