Advanced Focused Ion Beam Methods and Multimodal Microscopy Techniques for the Analysis of Epoxy-Embedded and Native Bio-Samples

De Castro O., Taubitz T., Berro Z., Audinot J.N., Wirtz T., Biesemeier A.

Microscopy and Microanalysis, vol. 30, n° 2024, pp. 1962, 2024

Abstract

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DE CASTRO Olivier

Advanced Instrumentation for Nano-Analytics

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AUDINOT Jean-Nicolas

Advanced Instrumentation for Nano-Analytics

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WIRTZ Tom

Scientific Instrumentation and Process Technology

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BIESEMEIER Antje

Advanced Instrumentation for Nano-Analytics

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