Magnetic Sector SIMS Systems for FIB Platforms: New Developments, Applications, and Prospects

Wirtz T., De Castro O., Hoang H.Q., Biesemeier A., Eswara S., Audinot J.N.

Microscopy and Microanalysis, vol. 30, n° 2024, pp. 508-509, 2024

Abstract

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WIRTZ Tom

Scientific Instrumentation and Process Technology

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DE CASTRO Olivier

Advanced Instrumentation for Nano-Analytics

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BIESEMEIER Antje

Advanced Instrumentation for Nano-Analytics

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ESWARA MOORTHY Santhana

Advanced Instrumentation for Nano-Analytics

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AUDINOT Jean-Nicolas

Advanced Instrumentation for Nano-Analytics

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